Events for March 20, 2026
IEEE EDS Webinar: A device to circuit framework for BTI, HCD aging
Overview Webinar EDS SCV/SF event, Topic: "A device to circuit framework for BTI, HCD aging ", Presenter: Dr. Souvik Mahapatra "A device to circuit framework for BTI, HCD aging" Lecture by Dr. Souvik Mahapatra The Electron Devices Society Santa Clara Valley/San Francisco joint Chapter and Device Reliability Physics committee are hosting Dr. Souvik Mahapatra. When: Friday, March 20th, 2026 – 11:45AM to 1:15PM (PDT) 11:45AM - 12PM: Introduction 12PM-12:45PM: Lecture 12:45PM-12:55PM: Q&A 1PM Adjourn Where: Zoom Zoom Join Zoom Meeting: https://us06web.zoom.us/j/86948608699?pwd=sDcIAavzNqtsSSpFw4T46sb9f331od.1 Meeting ID: 869 4860 8699 Passcode: 506028 — One tap mobile +16694449171,,86948608699#,,,,*506028# US +12532158782,,86948608699#,,,,*506028# US (Tacoma) Join instructions https://us06web.zoom.us/meetings/86948608699/invitations?signature=u7Zd4xYAj-EoKdgIHXfc2f3mSFDMZ6U2UJrR7D8OKN8 Contact: ieeescveds at gmail.com Speaker: Dr. Souvik Mahapatra Abstract: The benefit of performance gain per power is shrinking at advanced technology nodes. Several factors are responsible for this - including increased thermals, parasitics and aging issues. The traditional approach of treating aging as an afterthought with blanket guardbanding requires careful attention. In this talk we will propose a physics based device aging framework and its implementation in a circuit aging simulation platform. The framework can handle circuit aging under actual mission profiles (input activity and turbo-throttle conditions). Several possible approaches towards realistic / functional input based aging aware design modifications will be explored. Virtual: https://events.vtools.ieee.org/m/546751