Regulatory Changes for AI/ML Devices and Cybersecurity
Bldg: Plug and Play Tech Center, 440 N Wolfe Road, Sunnyvale, California, United States, Virtual: https://events.vtools.ieee.org/m/381461PSES SCV/SF/OEB Joint Chapter Presents: "Regulatory Changes for AI/ML Devices and Cybersecurity" (Co-hosted by the EMBS SCV Chapter) November 29, 2023 06:00 PM Pacific Time (US and Canada) Are you worried about AI taking over the world - or maybe just your medical procedure? Find out how new regulatory guidance provides safeguards and affects building medical device software. * Details at our Chapter website: https://r6.ieee.org/scv-pses/ Register for the online meeting at: https://us02web.zoom.us/meeting/register/tZAud-yurTovH9Z5HWBf6d52UN0T20e1i7gm or come to the in-person meeting at: Plug and Play Tech Center, 440 N Wolfe Road, Sunnyvale, CA Speaker(s): Dr. Groves, Dr. Sharma Bldg: Plug and Play Tech Center, 440 N Wolfe Road, Sunnyvale, California, United States, Virtual: https://events.vtools.ieee.org/m/381461
Semiconductor Ecosystem Accelerator
Room: Conference Center (ECC1), Bldg: Building E, 1st Floor, 2900 Semiconductor Drive, Santa Clara, California, United States, 95051, Virtual: https://events.vtools.ieee.org/m/382970Abstract Accelerating the development of a new semiconductor ecosystem requires the establishment of a new manufacturing paradigm. In an ever-more interconnected world, powered by IoT chips, new application-specific technologies are rapidly growing. A new agile manufacturing paradigm is needed to fabricate these devices with their unique requirements. InchFab has developed a modular fabrication platform which accelerates the development of new devices which will enable a new era of microfabrication innovation. Speaker(s): Dr. Mitchell Hsing, Agenda: 6:30 – 7:00 PM Registration & Networking 7:00 – 7:45 PM Invited Talk 7:45 – 8:00 PM Questions & Answers Room: Conference Center (ECC1), Bldg: Building E, 1st Floor, 2900 Semiconductor Drive, Santa Clara, California, United States, 95051, Virtual: https://events.vtools.ieee.org/m/382970